A single box, multi-channel solution for wideband mmWave measurements.ew available functionality has been introduced for the Keysight Technologies UXR-Series of oscilloscopes. It delivers fast, affordable, coherent analysis for wideband measurements up to 110GHz, accelerating development of next generation mmWave communications, satellite communications and radar applications.
In recent years, mmWave and RF technologies have pushed frequencies above 100GHz, with wide bandwidth needs easily reaching 10s of GHz.
Technologies such as 802.11ay (WiGig), 802.11ad (gigabit wireless), satellite communications, radar, and 5G, have frequencies that reach well into the mmWave spectrum.
Traditionally, measurements at these frequencies required a mixture of instruments and impairment causing down-converters or the need to purchase an expensive 1mm input oscilloscope with 80 to 110GHz of bandwidth.
Keysight's mmWave Wideband Analyser and UXR-Series oscilloscopes enable dynamic wideband analysis for frequencies of up to 110GHz.
Users get a bandwidth pricing model that matches typical RF equipment, in which the price correlates with the analysis bandwidth needed – eliminating the need to purchase the full frequency range the oscilloscope hardware supports.
Users can configure optional 5GHz or 10GHz analysis bandwidth windows within and above the UXR's natively licensed bandwidth – limited only by the hardware's maximum supported frequency range.
Hardware accelerated DDC to decimate oscilloscope captures in real-time enables deep captures exceeding several seconds of time and accelerating processing up to 100x faster than non-decimated measurements.
The solution offers availability of >2 GHz of Digital Down Conversion (DDC) analysis bandwidth that can be used in conjunction with available mmWave frequency extension options to extend DDC accelerated frequency ranges as high as 110GHz.
Superior signal integrity with error vector magnitude (EVM) below 0.6% for 5G new radio (NR) FR2 tests and % for 802.11ay technologies is offered. This means that EVM measurements taken now reflect the true device under test (DUT) performance, without impairments caused by noise of the measurement system.