Saelig Company has introduced the APPH30G, a high-performance cross-correlation phase noise test system for 5 MHz to 30 GHz frequencies. The APPH30G provides fast and accurate measurements of single sideband residual and additive phase noise, amplitude noise, and baseband noise.
The APPH30G is a fully self-contained instrument with cross-correlator engine and internal low noise reference sources to enable fast and accurate one-click measurements up to 30 GHz.
The APPH30G is a single-instrument solution that offers a set of measurement functions for evaluating RF & microwave signal sources such as crystal oscillators, PLL synthesizers, clocks, phase-locked VCOs, DROs, etc. It provides a comprehensive set of measurements such as phase and amplitude noise measurement, residual noise characterization or direct access to the FFT analyzer for baseband signal and (LF) noise analysis. Using proven cross-correlation measurement procedures and self-calibration routines, reproducible and accurate measurements are obtained even under changing environmental conditions. Fully automated frequency acquisition and self-calibration greatly simplify use and applicability of the instrument, resulting in much faster measurement throughput and greater ease-of-use in operation.
The APPH30G is optionally available with LAN (VXI-11), USBTMC, or GPIB interfaces. An intuitive platform-independent user interface, API library, and powerful SCPI command language set is provided. Measurements supported include: additive or absolute phase noise measurement using internal or external references, amplitude noise measurements and other automated measurements for evaluating RF signal sources. SSB phase noise, amplitude noise, AM noise measurement, additive or residual noise characterization, and baseband noise measurements up to 30GHz can easily be made for sources such as crystal oscillators, PLL synthesizers, clocks, phase-locked VCOs, DROs, and many others.
Designed to operate from external 6V DC (110V adapter provided) at up to 15,000 feet and 0 to 45 degC, the APPH30G can be configured to meet specific user requirements: selectable internal or external reference source, phase detector models, and frequency offset ranges. Two-channel cross-correlation is also supported for lowest noise measurements down to -180 dBc/Hz. Applications include general purpose phase noise tests, crystal oscillator and VCO testing, PLL synthesizer locking and characterization, supply noise verification, and automated production testing.