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EuMW 2018: Keysight to solve microwave challenges

10th September 2018
Mick Elliott
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At European Microwave Week 2018 (EuMW) in Madrid (September 24-27), Keysight Technologies will demonstrate a wide range of high frequency test equipment and solutions that help customers master microwave complexities as well as design, simulate, and test their latest innovations.

On display at the Keysight stand will be:

Solutions for mmWave Applications

  • Electronic Warfare Threat Simulation to analyse and measure pulse characteristics.
  • Microsatellite Field Test to test radio frequency (RF) flight hardware such as satellite payloads and transceivers.
  • Precise and reliable IoT measurements for easy, one-button measurements that quickly link cause and effect.
  • Design for Quantum Computing to create, deploy, and simulate custom hardware-accelerated Digital Signal Processing (DSP) into instruments.

5G and Wireless Solutions for Design and Test

  • 5G Base Station and Field Test to streamline 5G design validation at 28GHz and 37-39GHz with new wideband signal source and analyser families.
  • Millimeter-Wave Testbed to generate and analyse very wide-bandwidth millimetre-wave test signals.
  • Volume 5G manufacturing solutions for flexible, lean 5G new radio (NR) manufacturing test capabilities scalable from sub-6GHz to the new 24-43.5GHz mmWave bands.

Flexible mmWave Testing Solutions

  • Complete Transceiver Characterisation to address varying measurement results between test systems, or due to changes in test cables.
  • Zero Compromise USB Test Stations to decrease costs and get products to market faster by leveraging the same technology across all instrument platforms used in each phase of product development.

Software and Services

  • PathWave Asset Advisor for real time test asset utilisation and health data.
  • PathWave Design to connect circuit design, EM analysis, and system simulation.
  • PathWave Test to accelerate test workflow, with the power to collaborate and manage test projects from a web browser.

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