NI PXI Vector Network Analyser Reduces Testing Costs

30th October 2012

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Datasheet

National Instruments has unveiled the NI PXIe-5632 VNA, optimised to help engineers meet increasingly complex RF test requirements at a fraction of the cost, size and time compared to traditional rack-and-stack solutions. The new PXIe VNA is built on an innovative dual-source architecture with frequency range covering 300 kHz to 8.5 GHz, independently tuned sources and source access loops to cover a diverse set of measurement applications.

“NI continues its strong investment in RF and microwave instrumentation expanding the adoption of PXI into high-end applications,” said Jin Bains, Vice President of RF Research and Development at National Instruments.

“The extensive feature set of the NI PXIe-5632 VNA significantly reduces the cost of network measurements, especially in high-volume automated test applications that require highly accurate measurements, a fast measurement speed and a small footprint.”

Product Features:

• Two-port, 3-slot PXI Express VNA with frequency coverage from 300 kHz to 8.5 GHz

• Wide power range from -30dBm to +15dBm settable in 0.01dB steps for measuring compression and s-parameters of active devices • Dual-source architecture with source access loops for pulsed S-parameter measurements and extended source power range.

• Frequency offset capability using independently tuned sources for measuring frequency translation devices and hot S-parameters • Industry-leading programming interface for NI LabVIEW, ANSI C and .NET for simplified programming and fast test development times while maintaining RF measurement quality